Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects
نویسندگان
چکیده
منابع مشابه
Variability Study of Silicon Nanowire FETs
Yi-Bo Liao, Meng-Hsueh Chiang, Keunwoo Kim, and Wei-Chou Hsu Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan Department of Electronic Engineering, National Ilan University, I-Lan 260, Taiwan IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, USA E-mail: [email protected], Tel: +886-3-9357400 ext. 653, Fax: +886...
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ژورنال
عنوان ژورنال: Modelling and Simulation in Engineering
سال: 2014
ISSN: 1687-5591,1687-5605
DOI: 10.1155/2014/635803